ATPG

Automatic test pattern generation (ATPG) systems are tools for generating tests for digital circuits after they are produced.

Testing very-large-scale integrated circuits with a high fault coverage is a hard task because of their complexity. Different ATPG methods have to be applied to combinatorial and sequential circuits.

See also:

• Design for Test (DFT)
• Fault model
• ASIC
• VHSIC